Forming N-detection test sets from one-detection test sets without test generation

Irith Pomeranz, Sudhakar M. Reddy. Forming N-detection test sets from one-detection test sets without test generation. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]

Authors

Irith Pomeranz

This author has not been identified. Look up 'Irith Pomeranz' in Google

Sudhakar M. Reddy

This author has not been identified. Look up 'Sudhakar M. Reddy' in Google