Irith Pomeranz, Sudhakar M. Reddy. Forming N-detection test sets from one-detection test sets without test generation. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]
@inproceedings{PomeranzR05-0, title = {Forming N-detection test sets from one-detection test sets without test generation}, author = {Irith Pomeranz and Sudhakar M. Reddy}, year = {2005}, doi = {10.1109/TEST.2005.1584013}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584013}, researchr = {https://researchr.org/publication/PomeranzR05-0}, cites = {0}, citedby = {0}, pages = {9}, booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005}, publisher = {IEEE}, isbn = {0-7803-9038-5}, }