On test generation by input cube avoidance - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Irith Pomeranz, Sudhakar M. Reddy. On test generation by input cube avoidance. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 522-527, ACM, 2007. [doi]

This author has not been identified. Look up 'Irith Pomeranz' in GoogleThis author has not been identified. Look up 'Sudhakar M. Reddy' in Google

runs on WebDSL