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Irith Pomeranz, Sudhakar M. Reddy. On test generation by input cube avoidance. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 522-527, ACM, 2007. [doi]

The following publications are possibly variants of this publication:

Random Test Generation With Input Cube AvoidanceIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 17(1):45-54, 2009. [doi]

Dynamic test compaction for a random test generation procedure with input cube avoidanceIrith Pomeranz, Sudhakar M. Reddy. aspdac 2009: 672-677 [doi]

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