Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Irith Pomeranz, Sudhakar M. Reddy. Test Strength: A Quality Metric for Transition Fault Tests in Full-Scan Circuits. IEEE Trans. VLSI Syst., 19(10):1907-1911, 2011. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan CircuitsIrith Pomeranz, Sudhakar M. Reddy. tcad, 29(7):1135-1140, 2010. [doi] Design-for-testability to achieve complete coverage of delay faults in standard full scan circuitsIrith Pomeranz, Sudhakar M. Reddy. jsa, 47(3-4):357-373, 2001. [doi] Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based TestsIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 18(2):333-337, 2010. [doi]
The following publications are possibly variants of this publication: