The following publications are possibly variants of this publication:
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- Modular Compactor of Test ResponsesWojciech Rajski, Janusz Rajski. vts 2006: 242-251 [doi]
- On the effects of test compaction on defect coverageSudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara. vts 1996: 430-437 [doi]
- Compact test sets for high defect coverageSudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara. tcad, 16(8):923-930, 1997. [doi]
- Accumulator-Based Compaction of Test ResponsesJanusz Rajski, Jerzy Tyszer. TC, 42(6):643-650, 1993.
- Test response compactor with programmable selectorGrzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer. dac 2006: 1089-1094 [doi]
- Compact Delay Test Generation with a Realistic Low Cost Fault Coverage MetricZheng Wang, Duncan M. Hank Walker. vts 2009: 59-64 [doi]