A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry

Rahul M. Rao, Keith A. Jenkins, Jae-Joon Kim. A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry. J. Solid-State Circuits, 44(9):2616-2623, 2009. [doi]

@article{RaoJK09,
  title = {A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry},
  author = {Rahul M. Rao and Keith A. Jenkins and Jae-Joon Kim},
  year = {2009},
  doi = {10.1109/JSSC.2009.2025342},
  url = {https://doi.org/10.1109/JSSC.2009.2025342},
  researchr = {https://researchr.org/publication/RaoJK09},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {44},
  number = {9},
  pages = {2616-2623},
}