The following publications are possibly variants of this publication:
- A Completely Digital On-Chip Circuit for Local-Random-Variability MeasurementRahul M. Rao, Keith A. Jenkins, Jae-Joon Kim. isscc 2008: 412-413 [doi]
- An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a ProcessSaibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy 0001. jssc, 43(9):1951-1963, 2008. [doi]
- Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test StructureSaibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy. isscc 2007: 400-611 [doi]