Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita. On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 83-89, IEEE Computer Society, 2002. [doi]
@inproceedings{ReddyPTKK02,
title = {On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout},
author = {Sudhakar M. Reddy and Irith Pomeranz and Huaxing Tang and Seiji Kajihara and Kozo Kinoshita},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430083abs.htm},
tags = {testing, source-to-source, logic, open-source},
researchr = {https://researchr.org/publication/ReddyPTKK02},
cites = {0},
citedby = {0},
pages = {83-89},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}