On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout - researchr publication

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Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita. On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 83-89, IEEE Computer Society, 2002. [doi]

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