The following publications are possibly variants of this publication:
- Quiescent current analysis and experimentation of defective CMOS circuitsJ. A. Segura, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio. et, 3(4):337-348, 1992. [doi]
- Current Testing of CMOS Combinational Circuits with Single Floating Gate DefectsVíctor H. Champac, Joan Figueras. vlsi, 5(3):273-284, 1997. [doi]
- A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI CircuitsB. Alorda, Sebastià A. Bota, Jaume Segura. iolts 2005: 177-182 [doi]
- DDQ Detectable Bridges in Combinational CMOS CircuitsEugeni Isern, Joan Figueras. vlsi, 5(3):241-252, 1997. [doi]