Tohru Sasaki, Shunichi Kato, Nobuyoshi Nomizu, Hidetoshi Tanaka. Logic Design Verification Using Automated Test Generation. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 88-95, IEEE Computer Society, 1984.
@inproceedings{SasakiKNT84, title = {Logic Design Verification Using Automated Test Generation}, author = {Tohru Sasaki and Shunichi Kato and Nobuyoshi Nomizu and Hidetoshi Tanaka}, year = {1984}, tags = {testing, logic, design}, researchr = {https://researchr.org/publication/SasakiKNT84}, cites = {0}, citedby = {0}, pages = {88-95}, booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984}, publisher = {IEEE Computer Society}, }