The effects of test compaction on fault diagnosis - researchr publication authors

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Yun Shao, Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz. The effects of test compaction on fault diagnosis. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 1083-1089, IEEE Computer Society, 1999.

This author has not been identified. Look up 'Yun Shao' in GoogleThis author has not been identified. Look up 'Ruifeng Guo' in GoogleThis author has not been identified. Look up 'Sudhakar M. Reddy' in GoogleThis author has not been identified. Look up 'Irith Pomeranz' in Google

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