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The effects of test compaction on fault diagnosis

Yun Shao, Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz. The effects of test compaction on fault diagnosis. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 1083-1089, IEEE Computer Society, 1999.

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