Yun Shao, Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz. The effects of test compaction on fault diagnosis. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 1083-1089, IEEE Computer Society, 1999.
@inproceedings{ShaoGRP99,
title = {The effects of test compaction on fault diagnosis},
author = {Yun Shao and Ruifeng Guo and Sudhakar M. Reddy and Irith Pomeranz},
year = {1999},
tags = {testing},
researchr = {https://researchr.org/publication/ShaoGRP99},
cites = {0},
citedby = {0},
pages = {1083-1089},
booktitle = {Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999},
publisher = {IEEE Computer Society},
}