Charge-transferred presensing, negatively precharged word-line, and temperature-insensitive power-up schemes for low-voltage DRAMs

Jae-Yoon Sim, Kee-Won Kwon, Ki Chul Chun. Charge-transferred presensing, negatively precharged word-line, and temperature-insensitive power-up schemes for low-voltage DRAMs. J. Solid-State Circuits, 39(4):694-703, 2004. [doi]

Authors

Jae-Yoon Sim

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Kee-Won Kwon

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Ki Chul Chun

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