Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel. Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. In Adrian Evans, Stefano Di Carlo, Praveen Raghavan, Dimitris Gizopoulos, editors, Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, ERMAVSS 2016, co-located with IEEE/ACM Design, Automation and Test in Europe Conference (DATE 2016), Dresden, Germany, March 18, 2016. Volume 1566 of CEUR Workshop Proceedings, pages 38-40, CEUR-WS.org, 2016. [doi]
Abstract is missing.