Seung-hwan Song, Ki Chul Chun, Chris H. Kim. A Bit-by-Bit Re-Writable Eflash in a Generic 65 nm Logic Process for Moderate-Density Nonvolatile Memory Applications. J. Solid-State Circuits, 49(8):1861-1871, 2014. [doi]
@article{SongCK14,
title = {A Bit-by-Bit Re-Writable Eflash in a Generic 65 nm Logic Process for Moderate-Density Nonvolatile Memory Applications},
author = {Seung-hwan Song and Ki Chul Chun and Chris H. Kim},
year = {2014},
doi = {10.1109/JSSC.2014.2314445},
url = {http://dx.doi.org/10.1109/JSSC.2014.2314445},
researchr = {https://researchr.org/publication/SongCK14},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {49},
number = {8},
pages = {1861-1871},
}