A Bit-by-Bit Re-Writable Eflash in a Generic 65 nm Logic Process for Moderate-Density Nonvolatile Memory Applications

Seung-hwan Song, Ki Chul Chun, Chris H. Kim. A Bit-by-Bit Re-Writable Eflash in a Generic 65 nm Logic Process for Moderate-Density Nonvolatile Memory Applications. J. Solid-State Circuits, 49(8):1861-1871, 2014. [doi]

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