A Bit-by-Bit Re-Writable Eflash in a Generic 65 nm Logic Process for Moderate-Density Nonvolatile Memory Applications

Seung-hwan Song, Ki Chul Chun, Chris H. Kim. A Bit-by-Bit Re-Writable Eflash in a Generic 65 nm Logic Process for Moderate-Density Nonvolatile Memory Applications. J. Solid-State Circuits, 49(8):1861-1871, 2014. [doi]

Abstract

Abstract is missing.