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AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements

A. Sozza, A. Curutchet, C. Dua, N. Malbert, N. Labat, A. Touboul. AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements. Microelectronics Reliability, 46(9-11):1725-1730, 2006. [doi]

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A. Sozza

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A. Curutchet

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C. Dua

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N. Malbert

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N. Labat

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A. Touboul

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