AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements

A. Sozza, A. Curutchet, C. Dua, N. Malbert, N. Labat, A. Touboul. AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements. Microelectronics Reliability, 46(9-11):1725-1730, 2006. [doi]

Abstract

Abstract is missing.