A. Sozza, A. Curutchet, C. Dua, N. Malbert, N. Labat, A. Touboul. AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements. Microelectronics Reliability, 46(9-11):1725-1730, 2006. [doi]
@article{SozzaCDMLT06,
title = {AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements},
author = {A. Sozza and A. Curutchet and C. Dua and N. Malbert and N. Labat and A. Touboul},
year = {2006},
doi = {10.1016/j.microrel.2006.07.062},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.062},
tags = {C++, reliability},
researchr = {https://researchr.org/publication/SozzaCDMLT06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
pages = {1725-1730},
}