James H. Stathis, Barry P. Linder, R. RodrÃguez, Salvatore Lombardo. Reliability of ultra-thin oxides in CMOS circuits. Microelectronics Reliability, 43(9-11):1353-1360, 2003. [doi]
@article{StathisLRL03,
title = {Reliability of ultra-thin oxides in CMOS circuits},
author = {James H. Stathis and Barry P. Linder and R. RodrÃguez and Salvatore Lombardo},
year = {2003},
doi = {10.1016/S0026-2714(03)00242-7},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00242-7},
tags = {reliability},
researchr = {https://researchr.org/publication/StathisLRL03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {9-11},
pages = {1353-1360},
}