EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification

Andrew Stern, Ulbert Botero, Fahim Rahman, Domenic Forte, Mark Tehranipoor. EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification. IEEE Trans. VLSI Syst., 28(2):363-375, 2020. [doi]

Authors

Andrew Stern

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Ulbert Botero

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Fahim Rahman

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Domenic Forte

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Mark Tehranipoor

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