EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification - researchr publication related

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Andrew Stern, Ulbert Botero, Fahim Rahman, Domenic Forte, Mark Tehranipoor. EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification. IEEE Trans. VLSI Syst., 28(2):363-375, 2020. [doi]

The following publications are possibly variants of this publication:

EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICsAndrew Stern, Ulbert Botero, Bicky Shakya, Hao-Ting Shen, Domenic Forte, Mark Tehranipoor. itc 2018: 1-9 [doi]

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