Andrew Stern, Ulbert Botero, Fahim Rahman, Domenic Forte, Mark Tehranipoor. EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification. IEEE Trans. VLSI Syst., 28(2):363-375, 2020. [doi]
@article{SternBRFT20,
title = {EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification},
author = {Andrew Stern and Ulbert Botero and Fahim Rahman and Domenic Forte and Mark Tehranipoor},
year = {2020},
doi = {10.1109/TVLSI.2019.2949733},
url = {https://doi.org/10.1109/TVLSI.2019.2949733},
researchr = {https://researchr.org/publication/SternBRFT20},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {28},
number = {2},
pages = {363-375},
}