EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification - researchr publication

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Andrew Stern, Ulbert Botero, Fahim Rahman, Domenic Forte, Mark Tehranipoor. EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification. IEEE Trans. VLSI Syst., 28(2):363-375, 2020. [doi]

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