Transient power supply current monitoring - A new test method for CMOS VLSI circuits

Shyang-Tai Su, Rafic Z. Makki, Troy Nagle. Transient power supply current monitoring - A new test method for CMOS VLSI circuits. J. Electronic Testing, 6(1):23-43, 1995. [doi]

Authors

Shyang-Tai Su

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Rafic Z. Makki

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Troy Nagle

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