Tetsuya Suemitsu, Yoshino K. Fukai, Masami Tokumitsu, Fabiana Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni. Improved stability in wide-recess InP HEMTs by means of a fully passivated two-step-recess gate. IEICE Electronic Express, 3(13):310-315, 2006. [doi]
@article{SuemitsuFTRMZ06,
title = {Improved stability in wide-recess InP HEMTs by means of a fully passivated two-step-recess gate},
author = {Tetsuya Suemitsu and Yoshino K. Fukai and Masami Tokumitsu and Fabiana Rampazzo and Gaudenzio Meneghesso and Enrico Zanoni},
year = {2006},
doi = {10.1587/elex.3.310},
url = {http://dx.doi.org/10.1587/elex.3.310},
researchr = {https://researchr.org/publication/SuemitsuFTRMZ06},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {3},
number = {13},
pages = {310-315},
}