Yuuri Sugihara, Manabu Kotani, Kazuya Katsuki, Kazutoshi Kobayashi, Hidetoshi Onodera. A 90nm 8×16 FPGA Enhancing Speed and Yield Utilizing Within-Die Variations. In Proceedings of the 12th Conference on Asia South Pacific Design Automation, ASP-DAC 2007, Yokohama, Japan, January 23-26, 2007. pages 122-123, IEEE, 2007. [doi]
Abstract is missing.