Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks - researchr publication authors

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Manan Syal, Michael S. Hsiao, Sreejit Chakravarty. Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1034-1043, IEEE, 2004. [doi]

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