A Table-Based Approach to Study the Impact of Process Variations on FinFET Circuit Performance

Rajesh Amratlal Thakker, Chaitanya Sathe, Maryam Shojaei Baghini, Mahesh B. Patil. A Table-Based Approach to Study the Impact of Process Variations on FinFET Circuit Performance. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(4):627-631, 2010. [doi]

Authors

Rajesh Amratlal Thakker

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Chaitanya Sathe

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Maryam Shojaei Baghini

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Mahesh B. Patil

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