Rajesh Amratlal Thakker, Chaitanya Sathe, Maryam Shojaei Baghini, Mahesh B. Patil. A Table-Based Approach to Study the Impact of Process Variations on FinFET Circuit Performance. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(4):627-631, 2010. [doi]
Abstract is missing.