A Table-Based Approach to Study the Impact of Process Variations on FinFET Circuit Performance

Rajesh Amratlal Thakker, Chaitanya Sathe, Maryam Shojaei Baghini, Mahesh B. Patil. A Table-Based Approach to Study the Impact of Process Variations on FinFET Circuit Performance. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(4):627-631, 2010. [doi]

@article{ThakkerSBP10,
  title = {A Table-Based Approach to Study the Impact of Process Variations on FinFET Circuit Performance},
  author = {Rajesh Amratlal Thakker and Chaitanya Sathe and Maryam Shojaei Baghini and Mahesh B. Patil},
  year = {2010},
  doi = {10.1109/TCAD.2010.2042899},
  url = {http://dx.doi.org/10.1109/TCAD.2010.2042899},
  tags = {rule-based, systematic-approach},
  researchr = {https://researchr.org/publication/ThakkerSBP10},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {29},
  number = {4},
  pages = {627-631},
}