Characterization of Dynamic SRAM Stability in 45 nm CMOS

Seng Oon Toh, Zheng Guo, Tsu-Jae King Liu, Borivoje Nikolic. Characterization of Dynamic SRAM Stability in 45 nm CMOS. J. Solid-State Circuits, 46(11):2702-2712, 2011. [doi]

Authors

Seng Oon Toh

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Zheng Guo

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Tsu-Jae King Liu

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Borivoje Nikolic

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