Seng Oon Toh, Zheng Guo, Tsu-Jae King Liu, Borivoje Nikolic. Characterization of Dynamic SRAM Stability in 45 nm CMOS. J. Solid-State Circuits, 46(11):2702-2712, 2011. [doi]
@article{TohGLN11,
title = {Characterization of Dynamic SRAM Stability in 45 nm CMOS},
author = {Seng Oon Toh and Zheng Guo and Tsu-Jae King Liu and Borivoje Nikolic},
year = {2011},
doi = {10.1109/JSSC.2011.2164300},
url = {http://dx.doi.org/10.1109/JSSC.2011.2164300},
researchr = {https://researchr.org/publication/TohGLN11},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {46},
number = {11},
pages = {2702-2712},
}