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Seng Oon Toh, Zheng Guo, Tsu-Jae King Liu, Borivoje Nikolic. Characterization of Dynamic SRAM Stability in 45 nm CMOS. J. Solid-State Circuits, 46(11):2702-2712, 2011. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Large-Scale SRAM Variability Characterization in 45 nm CMOSZheng Guo, Andrew Carlson, Liang-Teck Pang, Kenneth Duong, Tsu-Jae King Liu, Borivoje Nikolic. jssc, 44(11):3174-3192, 2009. [doi]
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