Characterization of Dynamic SRAM Stability in 45 nm CMOS

Seng Oon Toh, Zheng Guo, Tsu-Jae King Liu, Borivoje Nikolic. Characterization of Dynamic SRAM Stability in 45 nm CMOS. J. Solid-State Circuits, 46(11):2702-2712, 2011. [doi]

Abstract

Abstract is missing.