A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems - researchr publication authors

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D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Hans-Joachim Wunderlich. A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems. J. Electronic Testing, 30(4):401-413, 2014. [doi]

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