Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits - researchr publication authors

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Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman. Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits. In Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, Ho Chi Minh City, Vietnam, January 13-15, 2010. pages 14-19, IEEE Computer Society, 2010. [doi]

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