Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman. Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits. In Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, Ho Chi Minh City, Vietnam, January 13-15, 2010. pages 14-19, IEEE Computer Society, 2010. [doi]
No references recorded for this publication.
No citations of this publication recorded.