Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman. Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits. In Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, Ho Chi Minh City, Vietnam, January 13-15, 2010. pages 14-19, IEEE Computer Society, 2010. [doi]
@inproceedings{UbarDRJ10-0,
title = {Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits},
author = {Raimund Ubar and Sergei Devadze and Jaan Raik and Artur Jutman},
year = {2010},
doi = {10.1109/DELTA.2010.32},
url = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2010.32},
researchr = {https://researchr.org/publication/UbarDRJ10-0},
cites = {0},
citedby = {0},
pages = {14-19},
booktitle = {Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, Ho Chi Minh City, Vietnam, January 13-15, 2010},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3978-2},
}