Harald P. E. Vranken, Ferry Syafei Sapei, Hans-Joachim Wunderlich. Impact of Test Point Insertion on Silicon Area and Timing during Layout. In 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France. pages 810-815, IEEE Computer Society, 2004. [doi]
Abstract is missing.