Clock control architecture and ATPG for reducing pattern count in SoC designs with multiple clock domains

Tom Waayers, Richard Morren, Xijiang Lin, Mark Kassab. Clock control architecture and ATPG for reducing pattern count in SoC designs with multiple clock domains. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 114-123, IEEE, 2010. [doi]

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