Clustered Fault Tolerance TSV Planning for 3-D Integrated Circuits

Qi Xu, Song Chen, Xiaodong Xu, Bei Yu. Clustered Fault Tolerance TSV Planning for 3-D Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(8):1287-1300, 2017. [doi]

Authors

Qi Xu

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Song Chen

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Xiaodong Xu

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Bei Yu

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