On the Detectability of Scan Chain Internal Faults An Industrial Case Study - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz. On the Detectability of Scan Chain Internal Faults  An Industrial Case Study. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 79-84, IEEE Computer Society, 2008. [doi]

This author has not been identified. Look up 'Fan Yang' in GoogleThis author has not been identified. Look up 'Sreejit Chakravarty' in GoogleThis author has not been identified. Look up 'Narendra Devta-Prasanna' in GoogleThis author has not been identified. Look up 'Sudhakar M. Reddy' in GoogleThis author has not been identified. Look up 'Irith Pomeranz' in Google

runs on WebDSL