Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz. On the Detectability of Scan Chain Internal Faults — An Industrial Case Study. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 79-84, IEEE Computer Society, 2008. [doi]
Abstract is missing.