Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz. On the Detectability of Scan Chain Internal Faults — An Industrial Case Study. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 79-84, IEEE Computer Society, 2008. [doi]
@inproceedings{YangCDRP08,
title = {On the Detectability of Scan Chain Internal Faults — An Industrial Case Study},
author = {Fan Yang and Sreejit Chakravarty and Narendra Devta-Prasanna and Sudhakar M. Reddy and Irith Pomeranz},
year = {2008},
doi = {10.1109/VTS.2008.13},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.13},
tags = {case study},
researchr = {https://researchr.org/publication/YangCDRP08},
cites = {0},
citedby = {0},
pages = {79-84},
booktitle = {26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA},
publisher = {IEEE Computer Society},
}