Lun Ye, Foong-Charn Chang, Peter Feldmann, Rakesh Chadha, Nagaraj Ns, Frank Cano. Chip-Level Verification for Parasitic Coupling Effects in Deep-Submicron Digital Designs. In 1999 Design, Automation and Test in Europe (DATE 99), 9-12 March 1999, Munich, Germany. pages 658-663, IEEE Computer Society, 1999. [doi]
Abstract is missing.